Pas Trademark Details
Word Mark | Pas |
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Status | Dead Registered 710 — Cancelled - Section 8 |
Serial Number | 74139934 |
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Registration Number | 1665747 |
Status Date | Tuesday, June 2, 1998 |
Filing Date | Tuesday, June 2, 1998 |
Registration Date | Tuesday, November 26, 1991 |
Attorney | Michael A. Stallman |
Correspondent
Michael A. Stallman
Limbach, Limbach & Sutton
2001 Ferry Building
San Francisco, CA 94111
Limbach, Limbach & Sutton
2001 Ferry Building
San Francisco, CA 94111
Case File Statements
Goods & Services | computer program for use with a device for measuring parameters of semiconductor wafers, including metal thickness and deposit monitoring, noncontact resistivity monitoring, grain structure monitoring, dielectric film thickness and RIE/plasma etch damage minimization |
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Classifications
International Class Codes |
009
|
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U.S. Class Codes | 038 |
Status | 2 — Sec. 8 – Entire Registration |
Status Date | Tuesday, June 2, 1998 |
First Use Anywhere | Tuesday, March 1, 1988 |
First Use In Commerce | Tuesday, March 1, 1988 |
Primary Code | 009 |
Trademark Timeline
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Mar 01 1988First use anywhere for the mark
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Mar 01 1988First use in commerce for the mark
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Feb 19 1991Trademark application filed with USPTO
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May 23 1991Assigned To Examiner
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May 29 1991Approved For Pub - Principal Register
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Aug 02 1991Notice of Publication
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Sep 03 1991Published For Opposition
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Nov 26 1991Registered-Principal Register
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Nov 26 1991Trademark officially registered with the USPTO
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Jun 02 1998Cancelled Sec. 8 (6-Yr)