Integrated Metrology Trademark Details

Integrated Metrology was registered on Tuesday, December 3, 2002 and is currently owned by Nanometrics Incorporated under the registration number 2657329 . This mark is alive with a status of Registered and Renewed. The last case file activity for this mark occured 10 years ago on Wednesday, June 5, 2013, according to the United State Patent & Trademark Office
Word Mark Integrated Metrology
Status Alive Registered 800 — Registered and Renewed

Current Owner

Nanometrics Incorporated of Milpitas, CA

View all trademarks for Nanometrics Incorporated
Other Trademarks for Nanometrics Incorporated
Serial Number 76075179
Registration Number 2657329
Status Date Wednesday, June 5, 2013
Filing Date Wednesday, June 5, 2013
Registration Date Tuesday, December 3, 2002
Attorney Anne H. Peck

Correspondent

Anne H. Peck
Cooley LLP
1299 Pennsylvania Ave NW, Suite 700
Washington DC 20004

Case File Statements

Goods & Services Thin film and wafer surface measurement and inspection products which are designed to fit inside or be mounted onto production equipment used in the manufacturing of integrated circuits, such as chemical mechanical polishers, chemical vapor deposition systems, and other related equipment

Classifications

International Class Codes
009 — Class 9 consists mostly of instruments used for controlling vehicles (such as ships), scientific research, and all computer programs and software regardless of the recording media such as CD-ROMs, hard drives, downloads, etc.
U.S. Class Codes 021, 023, 026, 036, 038
Status 6 — Active
Status Date Friday, August 18, 2000
First Use Anywhere Friday, June 29, 2001
First Use In Commerce Friday, June 29, 2001
Primary Code 009

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