Fei Company Tools For Nanotech Trademark Details
Word Mark | Fei Company Tools for Nanotech |
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Status | Dead Registered 710 — Cancelled - Section 8 |
Serial Number | 78641626 |
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Registration Number | 3431150 |
Status Date | Friday, December 26, 2014 |
Filing Date | Friday, December 26, 2014 |
Registration Date | Tuesday, May 20, 2008 |
Attorney | Jere M. Webb |
Correspondent
JERE M. WEBB
STOEL RIVES LLP
900 SW 5TH AVENUE
SUITE 2600
PTLAND, OR 97204-1268
STOEL RIVES LLP
900 SW 5TH AVENUE
SUITE 2600
PTLAND, OR 97204-1268
Case File Statements
Indication of Colors | Color is not claimed as a feature of the mark. |
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Disclaimer with Predetermined Text | "Company Tools for Nanotech" |
Goods & Services | Components of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, high brightness, sub-micron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, imaging, and ion beam milling, secondary ion mass spectrometry, focused electron beam columns for electron beam lithography, and electron beam microscopy and analysis, ion beam source emitters, electron beam source emitters; accessories of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, sample preparation equipment that prepares biological samples for examination by microscopes |
Goods & Services | Focused ion beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; Microscopes, scanning electron microscopes, scanning ion microscopes, atomic-force microscopes, and transmission electron microscopes; Microscopic system navigational software, namely, software that visually enhances the navigational, functional capability of spectroscopic, lithographic, and microscopic components; Application software and operation system software for operation of all the foregoing equipment, namely, software for use in microscopic imaging, milling and analysis; Computer software for manufacturing semi-conductors; Computer software for manufacturing data storage components; and computer software for manufacturing micro-machinery |
Goods & Services | Repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes; post-warranty repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes |
Goods & Services | Training in the operation of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes |
Goods & Services | Scientific analysis and high resolution imaging, namely, scanning electron and focused ion beam microscopy, in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological sciences and manufacture of devices with sub-micron features; Computer software support services, namely, trouble shooting of computer software problems, providing back up for computer software programs; Computer software consultation services; design and updating of computer software; project management relating to computer software; Computer software installation and maintenance; Providing information and advice relating to computer software |
Classifications
International Class Codes |
007
|
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U.S. Class Codes | 013, 019, 021, 023, 031, 034, 035 |
Status | 2 — Sec. 8 – Entire Registration |
Status Date | Friday, December 26, 2014 |
First Use Anywhere | Thursday, April 1, 2004 |
First Use In Commerce | Thursday, April 1, 2004 |
Primary Code | 007 |
International Class Codes |
009
|
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U.S. Class Codes | 021, 023, 026, 036, 038 |
Status | 2 — Sec. 8 – Entire Registration |
Status Date | Friday, December 26, 2014 |
First Use Anywhere | Thursday, April 1, 2004 |
First Use In Commerce | Thursday, April 1, 2004 |
Primary Code | 009 |
International Class Codes |
037
|
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U.S. Class Codes | 100, 103, 106 |
Status | 2 — Sec. 8 – Entire Registration |
Status Date | Friday, December 26, 2014 |
First Use Anywhere | Thursday, April 1, 2004 |
First Use In Commerce | Thursday, April 1, 2004 |
Primary Code | 037 |
International Class Codes |
041
|
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U.S. Class Codes | 100, 101, 107 |
Status | 2 — Sec. 8 – Entire Registration |
Status Date | Friday, December 26, 2014 |
First Use Anywhere | Thursday, April 1, 2004 |
First Use In Commerce | Thursday, April 1, 2004 |
Primary Code | 041 |
International Class Codes |
042
|
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U.S. Class Codes | 100, 101 |
Status | 2 — Sec. 8 – Entire Registration |
Status Date | Friday, December 26, 2014 |
First Use Anywhere | Thursday, April 1, 2004 |
First Use In Commerce | Thursday, April 1, 2004 |
Primary Code | 042 |
Trademark Timeline
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Apr 01 2004First use anywhere for the mark
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Apr 01 2004First use in commerce for the mark
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Apr 01 2004First use anywhere for the mark
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Apr 01 2004First use in commerce for the mark
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Apr 01 2004First use anywhere for the mark
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Apr 01 2004First use in commerce for the mark
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Apr 01 2004First use anywhere for the mark
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Apr 01 2004First use in commerce for the mark
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Apr 01 2004First use anywhere for the mark
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Apr 01 2004First use in commerce for the mark
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Jun 01 2005Trademark application filed with USPTO
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Jun 08 2005New Application Entered In Tram
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Aug 16 2005International filing request made
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Aug 16 2005Automatically Certified
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Aug 16 2005New Application For Ir Received
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Aug 16 2005Ir Certified and Sent To Ib
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Dec 14 2005Irregularity Notice Received From Ib
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Dec 21 2005Assigned To Examiner
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Jan 05 2006Non-Final Action E-Mailed
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Jan 05 2006Non-Final Action Written
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Mar 09 2006Irregularity Response Received From Applicant
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Mar 14 2006Response To Irregularity Reviewed and Accepted
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Mar 14 2006Irregularity Response Sent To Ib
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Mar 22 2006Irregularity Notice Received From Ib
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Jun 30 2006Irregularity Notice Received From Ib
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Jul 03 2006Correspondence Received In Law Office
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Jul 03 2006Paper Received
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Jul 27 2006Amendment From Applicant Entered
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Aug 15 2006Final Refusal E-Mailed
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Aug 15 2006Final Refusal Written
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Feb 15 2007Examiners Amendment E-Mailed
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Feb 15 2007Examiners Amendment -Written
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Feb 16 2007Examiner's Amendment Entered
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Feb 16 2007Assigned To Lie
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Feb 17 2007Approved For Pub - Principal Register
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Mar 01 2007Law Office Publication Review Completed
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Mar 15 2007Application For Ir Registered By Ib
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Mar 26 2007Withdrawn From Pub - Og Review Query
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May 16 2007Previous Allowance Count Withdrawn
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May 20 2007Approved For Pub - Principal Register
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May 20 2007Examiner's Amendment Entered
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May 20 2007Examiners Amendment E-Mailed
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May 20 2007Examiners Amendment -Written
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May 23 2007Law Office Publication Review Completed
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Aug 06 2007Withdrawn From Pub - Og Review Query
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Jan 07 2008Assigned To Examiner
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Jan 10 2008Assigned To Examiner
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Jan 10 2008Previous Allowance Count Withdrawn
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Jan 10 2008Assigned To Examiner
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Jan 11 2008Approved For Pub - Principal Register
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Jan 11 2008Examiner's Amendment Entered
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Jan 11 2008Notification of Examiners Amendment E-Mailed
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Jan 11 2008Examiners Amendment E-Mailed
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Jan 11 2008Examiners Amendment -Written
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Jan 31 2008Law Office Publication Review Completed
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Feb 13 2008Notice of Publication
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Mar 04 2008Published For Opposition
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May 20 2008Registered-Principal Register
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May 20 2008Trademark officially registered with the USPTO
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Aug 21 2008Partial Ceasing of Effect To Be Processed
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Nov 03 2008Ceasing of Effect Processed
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Nov 03 2008Partial Ceasing of Effect Notice Sent To Ib
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Mar 20 2009Partial Ceasing of Effect Processed By Ib
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Dec 26 2014Cancelled Sec. 8 (6-Yr)
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Mar 11 2016International Registration Cancelled By Ib